MOdeling and DEsign of Reliable, process variation-awareNanoelectronic devices, circuits and systems

Description

The objective of the MODERN project is to develop new paradigms in integrated circuit design which will enable the manufacturing of reliable, low cost, low EMI, high-yield complex products using unreliable and variable devices.

Specifically, the main goals of the project are:


1. Advanced, yet accurate, models of process variations for nanometer devices, circuits and complex architectures.
2. Effective methods for evaluating the impact of process variations on manufacturability, design reliability and circuit performance.
Reliability, noise, EMC/EMI.
Timing, power and yield.
3. Design methods and tools to mitigate or tolerate the effects of process variations on those quantities applicable at the device, circuit and architectural levels.
4. Validation of the modeling and design methods and tools on a variety of silicon demonstrators.

The MODERN Consortium features strong competence and expertise in the field of advanced technologies, with a well-balanced participation between industry and research institutes.

KEY DATES
  • Status
  • Completed
  • Project Launch
  • 01 March 2009
  • Project completed
  • 28 February 2012
circuit design nano-meter devices demonstration
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